Dr.A.P.J.Abdul Kalam University
Master of Science (Chemistry)
Third Semester Main Examination, Dec-2020
Diffraction Method & Photoelectron Spectroscopy (MSC-304T)
Time: 3:00 Hrs Max Marks 85
Note : Attempt all questions. Each question has two parts. Part A is 10 marks and part B is
7 marks.
Q.1 (a) Explain the Bragg condition in X-Ray diffraction.
(b) Write a short notes on miller indices.
OR
(a) Explain the Debye scherr method of X-Ray structural analysis of crystals.
(b) Describe the Duane hunt Law.
Q.2 (a) Explain the structure of simple lattices and X-Ray intensities.
(b) Write a short notes on absolute configuration of molecules.
OR
(a) Describe the procedure for an X-Ray structure analysis.
(b) Explain the phenomenon of crystal density.
Q.3 (a) Explain the function of SEM (Scaning Electron Microscopy) for measurement techniques.
(b) Write the differences between electron diffraction and X-Ray diffraction.
OR
(a) Explain the function of TEM (Transmission Electron Microscopy) for measurement
Techniques.
(b) Write a short notes on Resolution of electron microscope.
Q.4 (a) Explain the Neutron diffraction.
(b) Explain the Ferro magnetic structure.
OR
(a) Write the applications of Neutron diffraction.
(b) Explain the anti – Ferro magnetic structure.
Q.5 Write a short notes on: (any 4) (Marks 17)
(a) Photo electric effect.
(b) Ionization process.
(c) X-Ray photoelectron spectroscopy (XPS).
(b) ESCA
(e) Basic principle of photoelectron spectroscopy.
(f) Photoelectron spectra of simple molecules
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